{
  "name" : "VUT Device Characterization Platform",
  "description" : "YAML-driven orchestration of DC and CV measurements for NFET devices using GPIB/VISA instruments.",
  "elements" : [ {
    "tag" : "Person",
    "shape" : "Person"
  }, {
    "tag" : "SoftwareSystem",
    "shape" : "RoundedBox"
  }, {
    "tag" : "Container",
    "shape" : "RoundedBox"
  }, {
    "tag" : "Component",
    "shape" : "Box"
  }, {
    "tag" : "External",
    "opacity" : 70
  }, {
    "tag" : "Hardware",
    "shape" : "Hexagon"
  }, {
    "tag" : "DataStore",
    "shape" : "Cylinder"
  } ]
}